Nikon ECLIPSE L200D Inspection Microscope
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Nikon ECLIPSE L 200D Inspection Microscope
designed to perform optical inspection of wafers,
photo masks, reticles and other substrates with
exceptional precision. Designed to correct
chromatic aberrations over the entire field of view,
system’s objectives produce high contrast images
that are extremely sharp and have a minimum of
flare.
designed to perform optical inspection of wafers,
photo masks, reticles and other substrates with
exceptional precision. Designed to correct
chromatic aberrations over the entire field of view,
system’s objectives produce high contrast images
that are extremely sharp and have a minimum of
flare.
