| X-Ray Diffraction |
| Philips PW3040 X-Ray Diffractometer |
Technical Description:
X-ray Diffraction (XRD) is a powerful non-destructive technique for
characterizing crystalline materials. It provides information on
structures, phases, preferred crystal orientations (texture) and other
structural parameters such as average grain size, crystallinity, strain
and crystal defects. The x-ray diffraction pattern obtained from an
unknown sample is compared with reference patterns from the
extensive database of the International Centre for Diffraction Data
(ICDD). The major crystalline phases in an unknown sample can be
identified with this process. We are also able to provide a
semi-quantitative measure of phase concentration based on relative
peak intensity.
characterizing crystalline materials. It provides information on
structures, phases, preferred crystal orientations (texture) and other
structural parameters such as average grain size, crystallinity, strain
and crystal defects. The x-ray diffraction pattern obtained from an
unknown sample is compared with reference patterns from the
extensive database of the International Centre for Diffraction Data
(ICDD). The major crystalline phases in an unknown sample can be
identified with this process. We are also able to provide a
semi-quantitative measure of phase concentration based on relative
peak intensity.
