JEOL Scanning Electron Microscope Wafer Inspection System JWS-7500E
Download JWS-7500E Product Info.
Download JWS-7500E Facilities Guide
Basic Features:
  • Oxford EDS detector
  • Max Accelerating Voltage: 6KV
  • Cable length: 15m between operation console and power supply(5m between Main Console and Operation Console)
  • Parralax image software to save images (vs. printing)
  • Tilt: -15 to +60 degrees
  • Rotation: 360 degrees continuous
  • EOS resolution: 10nm
  • Stage accuracy: +/- 10 microns
  • Stage configuration: 8"

**Item is crated, but crates can be opened if needed for inspection**