JEOL Scanning Electron Microscope Wafer Inspection System JWS-7500E
Basic Features:
**Item is crated, but crates can be opened if needed for inspection**
- Oxford EDS detector
- Max Accelerating Voltage: 6KV
- Cable length: 15m between operation console and power supply(5m between Main Console and Operation Console)
- Parralax image software to save images (vs. printing)
- Tilt: -15 to +60 degrees
- Rotation: 360 degrees continuous
- EOS resolution: 10nm
- Stage accuracy: +/- 10 microns
- Stage configuration: 8"
**Item is crated, but crates can be opened if needed for inspection**
